螢光標記檢測濾光片運用等離子反應磁控濺射技術製造,具有高透射率、深截止度、高截止陡度等特點。通過對“Atto 425、FAM、SYBR、VIC、HEX、JOE、TET、TAMRA、Cy3、ROX、Texas Red、CY5、CY5.5”等常用螢光染料發光特性的深入研究,將濾光片光譜設計最佳化並使多通道螢光檢測的交叉串擾(串色)降到極低。
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技術參數
中心波長 | 400nm-850nm可選 |
半峰寬度 | 10nm-50nm (依儀器與相應螢光染料選擇) |
峰值透射率 | Tpk≥90% |
截止背景 | 300-1200nm, OD≥6 (or T≤0.0001%) |
產品尺寸 | 常用尺寸 Φ12mm(可客製其他尺寸) |
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常用規格
Part No. | FWHM | TPK | Blocking | Dye |
EX470 | 30nm | ≥90% | ODave≥OD6@300-1100nm | FAM |
EM525 | 20nm | ≥90% | ODave≥OD6@300-1100nm | |
DM490 | T≤2%455-485nm T>88%@510-900nm | |||
EX523 | 20nm | ≥90% | ODave≥OD6@300-1100nm | HEX/VIC |
EM564 | 20nm | ≥90% | ODave≥OD6@300-1100nm | |
DM550 | T≤1%@510-540nm T>90%@560-800nm | |||
EX543 | 20nm | ≥90% | ODave≥OD6@300-1100nm | CY3/TAMRA |
EM584 | 20nm | ≥90% | ODave≥OD6@300-1100nm | |
DM560 | T≤1%@503-547nm T>90%@570-750nm | |||
EX571 | 20nm | ≥90% | ODave≥OD6@300-1100nm | ROX/Texas Red |
EM612 | 20nm | ≥90% | ODave≥OD6@300-1100nm | |
DM590 | T≤1%@545-580nm T>90%@595-850nm | |||
EX624 | 40nm | ≥90% | ODave≥OD6@300-1100nm | CY5 |
EM692 | 40nm | ≥90% | ODave≥OD6@300-1100nm | |
DM650 | T≤1%@570-642nm T>90%@668-900nm | |||
EX655 | 20nm | ≥90% | ODave≥OD6@300-1100nm | CY5.5 |
EM716 | 20nm | ≥90% | ODave≥OD6@300-1100nm | |
DM685 | T≤1%@630-670nm T>90%@700-850nm |
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光譜曲線
- EX470-EM525
- EX521-EM564
- EX543-EM586
- EX570-EM614
- EX624-EM692
- EX655-EM716